Title :
AODE for Source Code Metrics for Improved Software Maintainability
Author :
Tian, Yingjie ; Chen, Chuanliang ; Zhang, Chunhua
Author_Institution :
Res. Centre on Fictitious Econ. & Data Sci., Chinese Acad. of Sci., Beijing, China
Abstract :
Software metrics are collected at various phases of the whole software development process, in order to assist in monitoring and controlling the software quality. However, software quality control is complicated, because of the complex relationship between these metrics and the attributes of a software development process. To solve this problem, many excellent techniques have been introduced into software maintainability domain. In this paper, we propose a novel classification method--Aggregating One-Dependence Estimators (AODE) to support and enhance our understanding of software metrics and their relationship to software quality. Experiments show that performance of AODE is much better than eight traditional classification methods and it is a promising method for software quality prediction. Furthermore, we present a Symmetrical Uncertainty (SU) based feature selection method to reduce source code metrics taking part in classification, make these classifiers more efficient and keep their performances not undermined meanwhile. Our empirical study shows the promising capability of SU for selecting relevant metrics and preserving original performances of the classifiers.
Keywords :
quality control; software maintenance; software metrics; software quality; AODE; aggregating one-dependence estimators; feature selection method; software development process; software maintainability; software metrics; software quality control; software quality prediction; source code metrics; symmetrical uncertainty; Capability maturity model; Computer science; Programming; Quality management; Software maintenance; Software metrics; Software quality; Support vector machine classification; Support vector machines; Uncertainty; Bayesian Classifier; Software Maintainability; Source Code Metrics; Symmetrical Uncertainty;
Conference_Titel :
Semantics, Knowledge and Grid, 2008. SKG '08. Fourth International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-3401-5
Electronic_ISBN :
978-0-7695-3401-5
DOI :
10.1109/SKG.2008.43