Title :
A complete set of characterizations on the NbN superconducting nanowire single photon detectors
Author :
Yan, Zhizhong ; Majedi, A.Hamed
Author_Institution :
Dept. of Electr.&Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
The recent advancement on niobium nitride (NbN) superconducting nanowire single photon detectors (SNSPDs) have drawn considerable attentions by many of their particular figures of merit. In this work, we report our experimental efforts resulting from combinations of dc, RF/microwave and optoelectronic characterizations of this device. The dc IV measurement is under-taken in the full voltage bias range and four distinct regimes are recognized and discussed. The kinetic inductance measurement allows us to gain insights on the electrical properties of the NbN nanowire. An equivalent circuitry model is constructed and simulated for the photoresponse in the course of RF/Microwave S-parameter measurement. The simulated photoresponse qualitatively agrees with the experimental results. Finally we apply continuous wave irradiation to investigate the optical interactions with superconducting nanowires. A relationship between chemical potential and optical power and wavelength has been experimentally confirmed. Two regimes have been identified and physically modeled. The comparison with experimental results displays a good agreement.
Keywords :
S-parameters; equivalent circuits; nanowires; niobium compounds; superconducting particle detectors; NbN; RF characterization; S-parameter measurement; chemical potential; continuous wave irradiation; dc IV measurement; dc characterizations; electrical properties; equivalent circuitry model; full voltage bias range; kinetic inductance measurement; microwave characterization; optical interactions; optical power; optoelectronic characterizations; photoresponse; superconducting nanowire single photon detectors; Circuit simulation; Detectors; Inductance measurement; Kinetic theory; Microwave circuits; Niobium compounds; Radio frequency; Scattering parameters; Superconducting microwave devices; Voltage;
Conference_Titel :
Science and Technology for Humanity (TIC-STH), 2009 IEEE Toronto International Conference
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-3877-8
Electronic_ISBN :
978-1-4244-3878-5
DOI :
10.1109/TIC-STH.2009.5444529