• DocumentCode
    2029697
  • Title

    An improved macro-model for simulation of single electron transistor (SET) using HSPICE

  • Author

    Karimian, M. ; Dousti, M. ; Pouyan, M. ; Faez, R.

  • Author_Institution
    Dept. of Electron. Eng., Sci., Islamic Azad Univ., Tehran, Iran
  • fYear
    2009
  • fDate
    26-27 Sept. 2009
  • Firstpage
    1000
  • Lastpage
    1004
  • Abstract
    To get a more accurate model for simulation of single electron transistors (SETs), we have proposed a new macro-model that includes the ability of electron tunneling time calculation. In our proposed model, we have modified the previous models and applied some basic corrections to their formulas. In addition, we have added a switched capacitor circuit, as a quantizer, to calculate the electron tunneling time. We used HSPICE for high-speed simulation and observed that the simulation results obtained from our model matched more closely with that of SIMON 2.0. We also could evaluate the time of electron tunneling through the barrier by using the quantizer. Clearly, our macro-model gives more accurate results than of the other models when compare with SIMON 2.0, and can be used for calculating the delay time of complicated circuits.
  • Keywords
    SPICE; simulation; single electron transistors; tunnelling; HSPICE; electron tunneling time calculation; macro-model; quantizer; simulation; single electron transistor; switched capacitor circuit; Circuit analysis; Circuit simulation; Integrated circuit modeling; Intrusion detection; Quantum computing; Quantum dots; SPICE; Single electron transistors; Switched capacitor circuits; Tunneling; HSPICE; Macro-model; Quantizer; SIMON; Single electron transistor (SET); Switched capacitor circuit;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology for Humanity (TIC-STH), 2009 IEEE Toronto International Conference
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-3877-8
  • Electronic_ISBN
    978-1-4244-3878-5
  • Type

    conf

  • DOI
    10.1109/TIC-STH.2009.5444535
  • Filename
    5444535