Title :
An improved macro-model for simulation of single electron transistor (SET) using HSPICE
Author :
Karimian, M. ; Dousti, M. ; Pouyan, M. ; Faez, R.
Author_Institution :
Dept. of Electron. Eng., Sci., Islamic Azad Univ., Tehran, Iran
Abstract :
To get a more accurate model for simulation of single electron transistors (SETs), we have proposed a new macro-model that includes the ability of electron tunneling time calculation. In our proposed model, we have modified the previous models and applied some basic corrections to their formulas. In addition, we have added a switched capacitor circuit, as a quantizer, to calculate the electron tunneling time. We used HSPICE for high-speed simulation and observed that the simulation results obtained from our model matched more closely with that of SIMON 2.0. We also could evaluate the time of electron tunneling through the barrier by using the quantizer. Clearly, our macro-model gives more accurate results than of the other models when compare with SIMON 2.0, and can be used for calculating the delay time of complicated circuits.
Keywords :
SPICE; simulation; single electron transistors; tunnelling; HSPICE; electron tunneling time calculation; macro-model; quantizer; simulation; single electron transistor; switched capacitor circuit; Circuit analysis; Circuit simulation; Integrated circuit modeling; Intrusion detection; Quantum computing; Quantum dots; SPICE; Single electron transistors; Switched capacitor circuits; Tunneling; HSPICE; Macro-model; Quantizer; SIMON; Single electron transistor (SET); Switched capacitor circuit;
Conference_Titel :
Science and Technology for Humanity (TIC-STH), 2009 IEEE Toronto International Conference
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-3877-8
Electronic_ISBN :
978-1-4244-3878-5
DOI :
10.1109/TIC-STH.2009.5444535