• DocumentCode
    2029718
  • Title

    2n Pattern run-length for test data compression

  • Author

    Chang, Cheng-Ho ; Lee, Lung-Jen ; Tseng, Wang-Dauh ; Lin, Rung-Bin

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Yuan Ze Univ., Taoyuan, Taiwan
  • fYear
    2010
  • fDate
    16-18 Dec. 2010
  • Firstpage
    562
  • Lastpage
    567
  • Abstract
    This paper presents a pattern run-length compression method. Compression is conducted by encoding 2|n| runs of compatible or inversely compatible patterns into codewords in both views either inside a single segment or across multiple segments. With the provision of high compression flexibility, this method can achieve significant compression. Experimental results for the large ISCAS´89 benchmark circuits have demonstrated that the proposed approach can achieve up to 67.64% of average compression ratio.
  • Keywords
    automatic test equipment; circuit testing; data compression; pattern classification; ISCAS´89 benchmark circuit; average compression ratio; inversely compatible pattern; pattern run length compression method; test data compression; Benchmark testing; Decoding; Encoding; Multiplexing; System-on-a-chip; Test data compression; automated test equipment (ATE); circuit under test (CUT); pattern run-length; test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Symposium (ICS), 2010 International
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-7639-8
  • Type

    conf

  • DOI
    10.1109/COMPSYM.2010.5685449
  • Filename
    5685449
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2029718