DocumentCode :
2029850
Title :
High-power GaN/AlGaN Ka-band HEMT´s on silicon carbide substrates
Author :
Torkhov, N.A. ; Bozhkov, V.G.
Author_Institution :
Sci.-Res. Inst. of Semicond., Tomsk, Russia
fYear :
2013
fDate :
8-14 Sept. 2013
Firstpage :
62
Lastpage :
63
Abstract :
The development of the 100×4 micron transistor design, the nano-structured hetero-layered materials and the technology with 0.15 to 0.2 micron design rules has made possible the production of power GaN/AlGaN Ka-band HEMT´s on silicon carbide substrates and measurements of their static and ultra-high-frequency characteristics (S-parameters). The HEMT parameters Gmax=8.89 dB and Pout~ 450 mW achieved at frequencies up to 40 GHz indicate the possibility of using them for creation of the SSI Ka-band power amplifiers.
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; gallium compounds; millimetre wave power transistors; nanostructured materials; power HEMT; semiconductor heterojunctions; silicon compounds; substrates; wide band gap semiconductors; 100x4 micron transistor design; GaN-AlGaN; S-parameters; SiC; high-power GaN/AlGaN Ka-band HEMT; nanostructured heterolayered materials; silicon carbide substrates; size 0.15 micron to 0.2 micron; static characteristics; ultra-high-frequency characteristics; Aluminum gallium nitride; Electronic mail; Gallium arsenide; Gallium nitride; HEMTs; Microwave amplifiers; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1
Type :
conf
Filename :
6652608
Link To Document :
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