• DocumentCode
    20302
  • Title

    Experimental measurements of the force-frequency effect of thickness-mode langasite resonators

  • Author

    Haifeng Zhang ; Turner, J.A. ; Kosinski, J.A.

  • Author_Institution
    Dept. of Eng. Technol., Univ. of North Texas, Denton, TX, USA
  • Volume
    60
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    1475
  • Lastpage
    1478
  • Abstract
    Because of their excellent temperature behavior, high piezoelectric coupling, low acoustic loss, and high Q-factor, langasite resonators have been the subject of recent interest for use in a variety of applications. The force-frequency effect refers to the phenomenon of frequency changes resulting from the stress applied to the resonator. A clear understanding of this effect is essential for many design applications such as force sensors and stress-compensated resonators. In this article, we report on experimental measurements of the force- frequency effect of various doubly-rotated langasite resonator samples with plano-plano configurations. Comparisons with the available experimental data for the force-frequency effect of quartz resonators are made. The application of this effect for sensors and stress-compensated resonators is also discussed.
  • Keywords
    crystal resonators; design applications; doubly rotated langasite resonator; force frequency effect; force-frequency effect; high Q-factor; low acoustic loss; piezoelectric coupling; stress-compensated resonator; temperature behavior; thickness mode langasite resonator;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2013.2719
  • Filename
    6552397