DocumentCode :
20302
Title :
Experimental measurements of the force-frequency effect of thickness-mode langasite resonators
Author :
Haifeng Zhang ; Turner, J.A. ; Kosinski, J.A.
Author_Institution :
Dept. of Eng. Technol., Univ. of North Texas, Denton, TX, USA
Volume :
60
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
1475
Lastpage :
1478
Abstract :
Because of their excellent temperature behavior, high piezoelectric coupling, low acoustic loss, and high Q-factor, langasite resonators have been the subject of recent interest for use in a variety of applications. The force-frequency effect refers to the phenomenon of frequency changes resulting from the stress applied to the resonator. A clear understanding of this effect is essential for many design applications such as force sensors and stress-compensated resonators. In this article, we report on experimental measurements of the force- frequency effect of various doubly-rotated langasite resonator samples with plano-plano configurations. Comparisons with the available experimental data for the force-frequency effect of quartz resonators are made. The application of this effect for sensors and stress-compensated resonators is also discussed.
Keywords :
crystal resonators; design applications; doubly rotated langasite resonator; force frequency effect; force-frequency effect; high Q-factor; low acoustic loss; piezoelectric coupling; stress-compensated resonator; temperature behavior; thickness mode langasite resonator;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2013.2719
Filename :
6552397
Link To Document :
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