DocumentCode :
2030325
Title :
Patterned Fabric Defect Detection using a Motif-Based Approach
Author :
Ngan, Henry Y T ; Pang, Grantham K H ; Yung, Nelson H C
Author_Institution :
Hong Kong Univ., Kowloon
Volume :
2
fYear :
2007
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
This paper proposed a patterned fabric defect detection method for sixteen out of seventeen wallpaper groups using a motif-based approach. From the symmetry properties of motifs, the energy of moving subtraction and its variance among motifs are mapped onto an energy-variance space. By learning the distribution of defect-free and defective patterns in this space, boundaries conditions can be determined for defect detection purpose. The proposed method is evaluated on four wallpaper categories, from which all 16 wallpaper groups can be generalized. Altogether, 160 defect-free lattices samples are used for learning the decision boundaries; and 200 other defect-free and 138 other defective samples are used for testing. An overall detection accuracy has reached 93.61%, which outperforms previous approaches.
Keywords :
fabrics; image texture; production engineering computing; defect-free pattern; defective pattern; energy-variance space; motif-based approach; patterned fabric defect detection; patterned texture; wallpaper group; Boundary conditions; Ceramics; Fabrics; Inorganic materials; Lattices; Manufacturing processes; Periodic structures; Power engineering and energy; Safety; Testing; Wallpaper group; defect detection; lattice; motif; patterned fabric;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2007.4379085
Filename :
4379085
Link To Document :
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