• DocumentCode
    2030325
  • Title

    Patterned Fabric Defect Detection using a Motif-Based Approach

  • Author

    Ngan, Henry Y T ; Pang, Grantham K H ; Yung, Nelson H C

  • Author_Institution
    Hong Kong Univ., Kowloon
  • Volume
    2
  • fYear
    2007
  • fDate
    Sept. 16 2007-Oct. 19 2007
  • Abstract
    This paper proposed a patterned fabric defect detection method for sixteen out of seventeen wallpaper groups using a motif-based approach. From the symmetry properties of motifs, the energy of moving subtraction and its variance among motifs are mapped onto an energy-variance space. By learning the distribution of defect-free and defective patterns in this space, boundaries conditions can be determined for defect detection purpose. The proposed method is evaluated on four wallpaper categories, from which all 16 wallpaper groups can be generalized. Altogether, 160 defect-free lattices samples are used for learning the decision boundaries; and 200 other defect-free and 138 other defective samples are used for testing. An overall detection accuracy has reached 93.61%, which outperforms previous approaches.
  • Keywords
    fabrics; image texture; production engineering computing; defect-free pattern; defective pattern; energy-variance space; motif-based approach; patterned fabric defect detection; patterned texture; wallpaper group; Boundary conditions; Ceramics; Fabrics; Inorganic materials; Lattices; Manufacturing processes; Periodic structures; Power engineering and energy; Safety; Testing; Wallpaper group; defect detection; lattice; motif; patterned fabric;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2007. ICIP 2007. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1437-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2007.4379085
  • Filename
    4379085