• DocumentCode
    2030451
  • Title

    Review of fault injection mechanisms and consequences on countermeasures design

  • Author

    Dutertre, Jean-Max ; Fournier, Jacques J. A. ; Mirbaha, Amir-Pasha ; Naccache, David ; Rigaud, Jean-Baptiste ; Robisson, B. ; Tria, Assia

  • Author_Institution
    Dept. Syst. et Archit. Securises (SAS), Ecole Nat. Super. des Mines de St.-Etienne (ENSMSE), Gardanne, France
  • fYear
    2011
  • fDate
    6-8 April 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The secret keys handled by cryptographic devices can be extracted using fault attacks associated with cryptanalysis techniques. These faults can be induced by different means such as laser exposure, voltage or clock glitches, electromagnetic perturbation, etc. This paper provides a detailed insight into the physics and mechanisms involved in several fault injection processes. The paper also highlights the difficulty to design countermeasures while even hardware duplication, usually considered as secure, has proved to show flaws against low cost fault injection means.
  • Keywords
    cryptography; fault diagnosis; integrated circuit reliability; clock glitches; countermeasure design; cryptanalysis techniques; cryptographic IC; cryptographic devices; electromagnetic perturbation; fault attacks; fault injection mechanisms; laser exposure; Circuit faults; Clocks; Cryptography; Hardware; Laser beams; Semiconductor lasers; Timing; Fault attack; hardware duplication; laser fault injection; timing constraints violation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2011 6th International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-61284-899-0
  • Type

    conf

  • DOI
    10.1109/DTIS.2011.5941421
  • Filename
    5941421