DocumentCode :
2030680
Title :
Nano-degradation of diamond surfaces by the thermochemical polishing technique
Author :
Weima, J.A. ; Job, R. ; Fahrner, W.R. ; Muller, N. ; Fries, T.
Author_Institution :
Dept. of Electron. Devices, Univ. of Hagen, Germany
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1856
Abstract :
The surface roughness of pre-polished polycrystalline diamond films was measured by the stylus profilometer to be 30 μm and 9 μm on the growth and substrate sides respectively. SEM topographic images of the films showed that the size of the crystallites forming the films ranged between 5-40 μm. The crystallites are seen to be oriented randomly in various planes and directions. AFM measurements performed on thermochemically polished diamond films revealed that the arithmetical mean deviation was reduced to 1.3 nm and 1.5 nm on both the growth and substrate sides respectively. Raman spectra of optical grade films polished at temperatures between 950-1050°C contained lines in the low frequency regime between 100-700 cm-1. The intensities of these lines are influenced by laser exposure time prior to measurement. The lines are tentatively attributed to nano-clusters formed by carbon particles which are left on the surfaces of the films during the polishing process. The spectra also entailed nano- and micro-crystalline graphite bands at frequencies of 1351 cm-1 and 1577 cm-1 respectively. These bands are attributed to disordered graphite of nano- and micro-sizes accumulated on the surface of the film as a result of thermochemical polishing
Keywords :
CVD coatings; Raman spectra; atomic force microscopy; chemical mechanical polishing; diamond; elemental semiconductors; scanning electron microscopy; surface topography measurement; thermochemistry; 5 to 40 micron; 950 to 1050 C; AFM measurements; CVD; Profilometry; Raman spectra; SEM; carbon particles; diamond surfaces; growth; laser exposure time; nano-clusters; nano-degradation; optical grade films; pre-polished polycrystalline diamond films; stylus profilometer; surface nano-degradation; surface roughness; thermochemical polishing; thermochemistry; topographic images; Crystallization; Frequency; Optical films; Performance evaluation; Rough surfaces; Substrates; Surface roughness; Surface topography; Temperature; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
Conference_Location :
Nagoya
Print_ISBN :
0-7803-6456-2
Type :
conf
DOI :
10.1109/IECON.2000.972558
Filename :
972558
Link To Document :
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