Title :
Low temperature operation of graded-channel SOI nMOSFETs for analog applications
Author :
Pavanello, M.A. ; Agopian, P. G Der ; Martino, J.A. ; Flandre, D.
Author_Institution :
University of Sao Paulo
Keywords :
Back; Capacitance; Doping; Intrusion detection; MOSFETs; Medical simulation; Numerical simulation; Temperature; Threshold voltage; Transconductance;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022444
