DocumentCode

2031270

Title

Low frequency noise versus temperature spectroscopy of Go JFETs, Si JFETs and Si MOSFETs

Author

Camin, Camin D. ; Colombo, Colombo C. ; Grassi, Grassi V.

Author_Institution

Universita and Istituto Nazionale di Fisica Nucleare

fYear

2002

fDate

2002

Firstpage

37

Lastpage

44

Keywords

Electron traps; FETs; Instruments; JFETs; Low-frequency noise; MOSFETs; Noise measurement; Performance evaluation; Spectroscopy; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on

ISSN

1155-4339

Print_ISBN

2-86883-606-2

Type

conf

DOI

10.1109/WOLTE.2002.1022447

Filename

1022447