• DocumentCode
    2031289
  • Title

    Cryogenic operation of sub-30 nm nMOSFETs: impact of device architecture

  • Author

    Bertrand, G. ; Deleonibus, S. ; Souil, D. ; Previtali, B. ; Caillat, C. ; Guegan, G. ; Sanquer, Marc ; Balestra, F.

  • Author_Institution
    Institut de Microelectronique
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    45
  • Lastpage
    49
  • Keywords
    Ballistic transport; Cryogenics; Degradation; Doping; Implants; MOSFETs; Temperature dependence; Temperature distribution; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
  • ISSN
    1155-4339
  • Print_ISBN
    2-86883-606-2
  • Type

    conf

  • DOI
    10.1109/WOLTE.2002.1022448
  • Filename
    1022448
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2031289