Title :
Parasitic conduction in a 0.13 μm CMOS technology at low temperature
Author :
Mercha, A. ; Rafi, J.M. ; Sirnoen, E. ; Augendre, E. ; Claeys, C.
Author_Institution :
IMEC
Keywords :
CMOS technology; Conductivity; Current measurement; Isolation technology; MOSFET circuits; Performance evaluation; Temperature measurement; Temperature sensors; Threshold voltage; Transconductance;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022451
