DocumentCode
2031384
Title
Temperature dependence of generation-recombination noise in p-n junctions
Author
Tejada, J. A Jiménez ; Godoy, A. ; Palma, A. ; Cartujo, P.
Author_Institution
Universidad de Granada
fYear
2002
fDate
2002
Firstpage
71
Lastpage
74
Keywords
Current measurement; Electron traps; Fluctuations; Frequency; Low-frequency noise; Noise generators; Noise measurement; P-n junctions; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
ISSN
1155-4339
Print_ISBN
2-86883-606-2
Type
conf
DOI
10.1109/WOLTE.2002.1022453
Filename
1022453
Link To Document