DocumentCode

2031460

Title

Mesoscopic transport characteristics of nano-scale SOI MOSFETs: coulomb blockade and localization

Author

Omura, Y. ; Yamamoto, M.

Author_Institution

Hokkaido University

fYear

2002

fDate

2002

Firstpage

93

Lastpage

96

Keywords

Current measurement; Cyclotrons; Electrons; Interference; MOSFETs; Morphology; Silicon; Temperature measurement; Voltage; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on

ISSN

1155-4339

Print_ISBN

2-86883-606-2

Type

conf

DOI

10.1109/WOLTE.2002.1022457

Filename

1022457