Electron transport in silicon nanostructures based on ultra-thin SOI
Author :
Pouydebasque, A. ; Montes, L. ; Zimmermann, J. ; Balestra, F. ; Fraboulet, D. ; Mariolle, D. ; Gautier, J. ; Schopfer, F. ; Bouchiat, V. ; Saminadayar, L.
Author_Institution :
Institut de Microelectronique, Electromagnetisme et Photonique
fYear :
2002
fDate :
2002
Firstpage :
97
Lastpage :
101
Keywords :
Electrical resistance measurement; Electrons; Geometry; Magnetic field measurement; Magnetic materials; Magnetoresistance; Nanostructures; Silicon on insulator technology; Temperature distribution; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
