• DocumentCode
    2031541
  • Title

    A pyrex nanochannel device fabricated by AFM nanolithography

  • Author

    Hibbert, Orain ; Busch, Taylor ; Tung, Steve

  • Author_Institution
    Micoelectronics-Photonics Grad. Program, Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2012
  • fDate
    5-8 March 2012
  • Firstpage
    90
  • Lastpage
    94
  • Abstract
    A Pyrex nanochannel device was fabricated using AFM nanolithography in conjunction with MEMS-based microfabrication. The fabrication process began with the patterning of microchannels on a Pyrex substrate using photolithography and wet etching. AFM nanolithography was then performed to realize a nanochannel between the micro reservoirs. A diamond-coated AFM probe with a relatively large force constant served as the cutting tool. A detailed study was conducted to determine the relationship between the AFM input parameters and the resultant nanochannel dimensions. A linear trend was obtained between the AFM scratch force and the nanochannel depth. A similar trend was also observed between the number of repeated scratches and the channel depth. Minimal material pileup on the nanochannel sidewall was observed during the scratch process. Flow patency in the capped-off nanochannel was demonstrated through fluorescence microscopy.
  • Keywords
    atomic force microscopy; etching; microfabrication; micromechanical devices; nanolithography; photolithography; AFM nanolithography; AFM scratch force; MEMS-based microfabrication; Pyrex nanochannel device; capped-off nanochannel; channel depth; cutting tool; diamond-coated AFM probe; fluorescence microscopy; llow patency; microchannel patterning; microreservoirs; photolithography; wet etching; Glass; Microchannel; Micromechanical devices; Nanoelectromechanical systems; Nanolithography; Photodetectors; Atomic force microscopy (AFM); DNA sequencing; Nanochannel; Nanofluidics; Nanolithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-1122-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2012.6196730
  • Filename
    6196730