DocumentCode
2031544
Title
Random telegraph noise in ultimate MOSFETs at very low temperature in the subthreshold regime
Author
Jehl, X. ; Sanquer, M. ; Bertrand, G. ; Guégan, G. ; Deleonibus, Simon
Author_Institution
CEA Grenoble
fYear
2002
fDate
2002
Firstpage
107
Lastpage
110
Keywords
Capacitance; Intrusion detection; MOSFETs; Quantum mechanics; Resonance; Resonant tunneling devices; Spectroscopy; Telegraphy; Temperature sensors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
ISSN
1155-4339
Print_ISBN
2-86883-606-2
Type
conf
DOI
10.1109/WOLTE.2002.1022460
Filename
1022460
Link To Document