Title :
Investigations on the low-power and low-frequency noise performance of pHEMT at 4.2 K
Author :
Lucas, Lucas T. ; Jin, Jin Y.
Author_Institution :
LPN, MRS
Keywords :
Capacitance; Cryogenics; Gallium arsenide; HEMTs; Leakage current; Low-frequency noise; MODFETs; PHEMTs; Power supplies; Voltage;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022463
