DocumentCode :
2031818
Title :
Analysis of ferroelectric characteristics and HV pulse experiments on X7R ceramic capacitors
Author :
Dai, Ling ; Lin, Fuchang ; Zhu, Zhifang ; Li, Jin
Author_Institution :
Lab. of High Voltage, Huazhong Univ. of Sci. & Technol., Hubei, China
fYear :
2004
fDate :
17-20 Oct. 2004
Firstpage :
97
Lastpage :
100
Abstract :
X7R ceramic material is regarded as a sound developing direction to produce high energy density capacitors owing to its high dielectric constant (from 3000 to 105) and moderate temperature characteristics. The most important characteristics of X7R is ferroelectricity. In this paper, some samples of HV X7R multilayer ceramic capacitors (MLC) with large capacitance have been made and their electrical behavior in a pulsed discharge circuit have been tested. On the basis of a thorough interpretation of the ferroelectricity, the paper analyzes the special electrical characteristics of MLC, which includes the change of capacitance, particular discharge wave, high dielectric loss, and the life curve. The results of a series of experiments of samples coincided with the above theoretical analysis. In conclusion, the MLC of X7R has good discharge wave, and stable life curve. Some measures must be taken to cool the capacitors due to their high dielectric loss.
Keywords :
capacitance; ceramic capacitors; dielectric losses; ferroelectric capacitors; ferroelectricity; permittivity; BaTiO3; MLC; X7R multilayer ceramic capacitors; capacitance change; ceramic capacitor ferroelectric characteristics; dielectric constant; dielectric loss; discharge wave; ferroelectricity; high energy density capacitors; life curve; pulsed discharge circuit; Acoustic materials; Capacitance; Capacitors; Ceramics; Circuit testing; Dielectric loss measurement; Dielectric losses; Dielectric materials; Ferroelectric materials; High-K gate dielectrics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN :
0-7803-8584-5
Type :
conf
DOI :
10.1109/CEIDP.2004.1364198
Filename :
1364198
Link To Document :
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