Title :
Study of the low frequency noise from 77 K to 300 K in NbN semiconductor thin films deposited on silicon
Author :
Leroy, G. ; Gest, J. ; Tabourier, P. ; Carru, J.C. ; Xavier, P. ; Andre, E. ; Chaussy, J.
Author_Institution :
Laboratoire d´´Etude des Materiaux et des Composants pour l´´Electronique
Keywords :
Electrical resistance measurement; Frequency measurement; Low-frequency noise; Noise measurement; Semiconductor device noise; Semiconductor films; Semiconductor materials; Semiconductor thin films; Superconducting device noise; Superconducting films;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022476
