Title :
A 4.2 K readout channel in a standard 0.7 μm CMOS process for a photoconductor array camera
Author :
Creten, Y. ; Charlie, O. ; Merken, P. ; Putzeys, J. ; Van Hoof, C.
Author_Institution :
Imec MCP-DET
Keywords :
CMOS image sensors; CMOS process; Cameras; Circuit simulation; Circuit testing; Cryogenics; Hysteresis; Low-frequency noise; Photoconductivity; Temperature;
Conference_Titel :
Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on
Print_ISBN :
2-86883-606-2
DOI :
10.1109/WOLTE.2002.1022481
