DocumentCode :
2032179
Title :
Simultaneously printing the redistribution layer and filling of TSVs using a microengineered screen
Author :
Kay, R.W. ; Cummins, G. ; Ng, Jack H.-G. ; Terry, J.G. ; Desmulliez, Marc Philippe Y. ; Walton, A.J.
Author_Institution :
Additive Manuf. Res. Group, Loughborough Univ., Loughborough, UK
fYear :
2012
fDate :
5-7 Dec. 2012
Firstpage :
14
Lastpage :
18
Abstract :
This article reports the results obtained by screen printing through a microengineered electroformed nickel screen to successfully fill TSVs and print a redistribution layer on Si wafers. Redistribution lines were deposited down to 40μm width at 70μm pitch. Straight through hole sections on the microengineered screen formed a stencil/screen hybrid region enabling TSVs to be filled down to 8.5:1 aspect ratio. However multiple print passes were required to completely fill the vias. Rheological properties of the printing medium play a major impact on the print printing performance.
Keywords :
elemental semiconductors; printing; rheology; semiconductor technology; silicon; three-dimensional integrated circuits; Si; TSV filling; microengineered electroformed screen; print printing performance; printing medium; redistribution layer; redistribution layer printing; redistribution lines; rheological properties; screen hybrid region; screen printing; stencil hybrid region; straight through hole sections; Apertures; Filling; Packaging; Printing; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
Type :
conf
DOI :
10.1109/EPTC.2012.6507042
Filename :
6507042
Link To Document :
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