DocumentCode :
2032190
Title :
NEMS based thermal management for 3D many-core system
Author :
Huang, Xiwei ; Yu, Hao ; Zhang, Wei
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2011
fDate :
8-9 June 2011
Firstpage :
218
Lastpage :
223
Abstract :
Leakage power has become the dominant factor to the total power consumption when technology scales down to nano-region. Moreover, due to the exponential relationship between leakage power and temperature, positive feedback loop can cause thermal-runaway hazard. This poses a significant barrier for 3D integration of multi-cache-core processor, which has high I/O bandwidth but also has high leakage-power density and long heat-removal path. Nano-Electro-Mechanical Switches (NEMS) are among the most promising emerging devices to solve the thermal-runaway problem due to their zero leakage current and infinite sub-threshold slope. In order to have a proper control of thermal-runaway hazard for many-core system, this paper studies hybrid CMOS-NEMS designs of thermal buffer and power gating to reduce leakage power and thermal-runaway at thermal-time-constant scale. Experimental results show that our proposed NEMS based thermal management can effectively prevent the thermal-runaway in 3D multi-cache-core processor.
Keywords :
CMOS integrated circuits; leakage currents; microprocessor chips; multiprocessing systems; nanoelectromechanical devices; thermal management (packaging); 3D integration; 3D many-core system; 3D multi-cache-core processor; heat-removal path; hybrid CMOS-NEMS designs; leakage current; leakage power; positive feedback loop; power gating; sub-threshold slope; thermal buffer; thermal management; thermal-runaway hazard; thermal-time-constant scale; CMOS integrated circuits; CMOS technology; Heating; Nanoelectromechanical systems; Thermal management; Three dimensional displays; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoscale Architectures (NANOARCH), 2011 IEEE/ACM International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0993-7
Type :
conf
DOI :
10.1109/NANOARCH.2011.5941507
Filename :
5941507
Link To Document :
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