DocumentCode :
2032213
Title :
Design space exploration of clock-pumping techniques to reduce through-silicon-via (TSV) manufacturing cost in 3-d integration
Author :
Weldezion, Awet Yemane ; Weerasekara, R. ; Tenhunen, Hannu
Author_Institution :
Dept. of Electron. Syst., KTH-R. Inst. of Technol., Kista, Sweden
fYear :
2012
fDate :
5-7 Dec. 2012
Firstpage :
19
Lastpage :
22
Abstract :
In this paper, we explore the cost of clock pumping techniques implemented for scalable 3-D Integrated Systems in the complexity of interconnect, circuit, and architecture level changes. Their effect in terms of area and power for comparable performance is estimated. Our results show that by using 50% of the number of TSVs, we achieve the same performance as standard implementation with insignificant area and power overhead from the overall system cost. The proposed pumping technique can be used as one of the components in 3-D systems design for several applications that require logic-on-logic or memory-on-logic stacking.
Keywords :
clocks; integrated circuit design; integrated circuit interconnections; three-dimensional integrated circuits; 3D integration; TSV manufacturing cost reduction; architecture level; clock-pumping techniques; design space exploration; interconnection complexity; logic-on-logic stacking; memory-on-logic stacking; through-silicon-via manufacturing cost reduction; Clocks; Decoding; Integrated circuit interconnections; Integrated circuit modeling; Manufacturing; Standards; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
Type :
conf
DOI :
10.1109/EPTC.2012.6507043
Filename :
6507043
Link To Document :
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