DocumentCode :
2032551
Title :
Channel modeling based on interference temperature in underlay cognitive wireless networks
Author :
Sharma, Manuj ; Sahoo, Anirudha ; Nayak, K.D.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Bombay, Mumbai, India
fYear :
2008
fDate :
21-24 Oct. 2008
Firstpage :
224
Lastpage :
228
Abstract :
Cognitive radio based dynamic spectrum access network is emerging as a technology to address spectrum scarcity. In this study, we assume that the channel is licensed to some primary (licensed) operator. We consider a sensor network with cognitive radio capability that acts as a secondary (unlicensed) network and uses the channel in underlay mode. The secondary network uses interference temperature model to ensure that the interference to the primary devices remain below a predefined threshold. We use hidden Markov model (HMM) to model the interference temperature dynamics of a primary channel. The HMM is trained using Baum-Welch procedure. The trained HMM is shown to be statistically stable. Secondary nodes use this trained HMM to predict the interference temperature of the channel in future time slots and computes the value of channel availability metric (CAM) for the channel. CAM is used by secondary nodes to select a primary channel for transmission. Results of application of such trained HMMs in channel selection in multi-channel wireless network are presented.
Keywords :
cognitive radio; hidden Markov models; radio access networks; radiofrequency interference; wireless channels; wireless sensor networks; channel availability metrics; cognitive multichannel wireless sensor network; cognitive radio; dynamic spectrum access network; hidden Markov model; interference temperature; Antenna measurements; CADCAM; Cognitive radio; Computer aided manufacturing; Hidden Markov models; Interference; Power measurement; Receiving antennas; Temperature sensors; Wireless networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communication Systems. 2008. ISWCS '08. IEEE International Symposium on
Conference_Location :
Reykjavik
Print_ISBN :
978-1-4244-2488-7
Electronic_ISBN :
978-1-4244-2489-4
Type :
conf
DOI :
10.1109/ISWCS.2008.4726051
Filename :
4726051
Link To Document :
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