• DocumentCode
    2032671
  • Title

    Through-Silicon Interposer (TSI) co-design optimization for high performance systems

  • Author

    Cubillo, Joseph Romen ; Weerasekera, Roshan ; Katti, Guruprasad ; Patti, Robert

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    93
  • Lastpage
    98
  • Abstract
    Driven by the internet bandwidth ever increasing demand, modern logic integrated circuits (IC) need to cope for logic to memory (DRAM) data throughput above the Terabit per seconds (Tbps) range [1]. Such logic to DRAM interface is affected by the memory wall bottlenecks like: logic operating at much higher throughput and lower latency than DRAM individual modules, and with limited pin count capability organic packaging solutions leading to system architecture using serialization techniques (at the expense of power dissipation and additional circuit latency). Those bottlenecks cannot be addressed individually and need a more global approach with new packaging solutions, new devices and overall enhanced architecture. We will present in this study a silicon packaging solution that can be optimized to achieve the highest possible throughput between logic and DRAM. First, we will explain the concept of high performance silicon carrier with its key specifications as well as the metrics to be analyzed, and then we will provide design rules guidelines and a methodology to optimize such silicon carrier for the highest possible throughput performance.
  • Keywords
    DRAM chips; elemental semiconductors; integrated circuit design; integrated circuit packaging; integrated logic circuits; silicon; DRAM data; DRAM individual modules; IC; Internet bandwidth; Si; high performance silicon carrier; high performance systems; limited pin count capability organic packaging solutions; logic integrated circuits; logic-to-memory data; serialization techniques; silicon packaging solution; system architecture; through-silicon interposer codesign optimization; Bit rate; Impedance; Packaging; Random access memory; Silicon; Throughput; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507058
  • Filename
    6507058