Fluctuation Smoothing Production Control at IBM´s 200mm Wafer Fabricator: Extensions, Application and the Multi-Flow Production Index (MFPx)

Author

Morrison, James R. ; Dews, Elizabeth ; LaFreniere, John

Author_Institution

Dept. of Eng. & Technol., Central Michigan Univ., Mount Pleasant, MI

fYear

2006

fDate

22-24 May 2006

Firstpage

134

Abstract

To increase the flexibility of existing production control algorithms and reduce the variation and mean of fabricator cycle times, a fluctuation smoothing for the variation of cycle time (FSVCT) policy was implemented at IBM´s 200mm semiconductor wafer fabrication facility. Extensions allowing for products with different cycle times and enabling the change of cycle time targets during production were developed. The policy was named the multi-flow production index (MFPx), reflective of its capabilities. Increased production agility and a controlled variation of cycle time resulted from the implementation

Keywords

production control; production facilities; 200 mm; cycle times; fluctuation smoothing; multiflow production index; production control algorithms; semiconductor wafer fabrication facility; Analytical models; Costs; Customer satisfaction; Fabrication; Fluctuations; Lead time reduction; Production control; Semiconductor device manufacture; Smoothing methods; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE

Conference_Location

Boston, MA

ISSN

1078-8743

Print_ISBN

1-4244-0254-9

Type

conf

DOI

10.1109/ASMC.2006.1638737

Filename

1638737