DocumentCode
2032733
Title
Dynamic Wet-Furnace Dispatching/Scheduling in Wafer Fab
Author
Ham, Myoungsoo ; Raiford, Michael ; Dillard, Frank ; Risner, Wayne ; Knisely, Meghan ; Harrington, James ; Murtha, Tom ; Park, HyungTae
Author_Institution
Samsung Austin Semi., TX
fYear
2006
fDate
22-24 May 2006
Firstpage
144
Lastpage
147
Abstract
The pre-cleaning equipment (or wet etch) in semiconductor manufacturing can load more than one dozen lots at one time. Because of the large capacity, the wet etch plays a key role in keeping the line balanced. After the wet etch operation, the wafers go mainly to furnaces, and the remaining goes to dry etch, CVD, photo or back to wet etch. If the wet etch produces the wafers in unbalanced fashion, the downstream equipment can be starved for inventory. Furthermore, there are often queue time restrictions between the wet etch and the downstream step and vice versa. This paper shows the success story of developing and implementing the wet etch scheduler which enables us to insure the proper inventory level at downstream steps and meet the queue time restriction at Samsung Austin Semiconductor
Keywords
dispatching; etching; inventory management; scheduling; semiconductor device manufacture; dry etch; dynamic wet-furnace dispatching; dynamic wet-furnace scheduling; pre-cleaning equipment; queue time restrictions; semiconductor manufacturing; wafer fab; wet etch; Dispatching; Dry etching; Dynamic scheduling; Furnaces; Glass manufacturing; Job shop scheduling; Manufacturing processes; Robot kinematics; Semiconductor device manufacture; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
Conference_Location
Boston, MA
ISSN
1078-8743
Print_ISBN
1-4244-0254-9
Type
conf
DOI
10.1109/ASMC.2006.1638739
Filename
1638739
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