• DocumentCode
    2032733
  • Title

    Dynamic Wet-Furnace Dispatching/Scheduling in Wafer Fab

  • Author

    Ham, Myoungsoo ; Raiford, Michael ; Dillard, Frank ; Risner, Wayne ; Knisely, Meghan ; Harrington, James ; Murtha, Tom ; Park, HyungTae

  • Author_Institution
    Samsung Austin Semi., TX
  • fYear
    2006
  • fDate
    22-24 May 2006
  • Firstpage
    144
  • Lastpage
    147
  • Abstract
    The pre-cleaning equipment (or wet etch) in semiconductor manufacturing can load more than one dozen lots at one time. Because of the large capacity, the wet etch plays a key role in keeping the line balanced. After the wet etch operation, the wafers go mainly to furnaces, and the remaining goes to dry etch, CVD, photo or back to wet etch. If the wet etch produces the wafers in unbalanced fashion, the downstream equipment can be starved for inventory. Furthermore, there are often queue time restrictions between the wet etch and the downstream step and vice versa. This paper shows the success story of developing and implementing the wet etch scheduler which enables us to insure the proper inventory level at downstream steps and meet the queue time restriction at Samsung Austin Semiconductor
  • Keywords
    dispatching; etching; inventory management; scheduling; semiconductor device manufacture; dry etch; dynamic wet-furnace dispatching; dynamic wet-furnace scheduling; pre-cleaning equipment; queue time restrictions; semiconductor manufacturing; wafer fab; wet etch; Dispatching; Dry etching; Dynamic scheduling; Furnaces; Glass manufacturing; Job shop scheduling; Manufacturing processes; Robot kinematics; Semiconductor device manufacture; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    1-4244-0254-9
  • Type

    conf

  • DOI
    10.1109/ASMC.2006.1638739
  • Filename
    1638739