DocumentCode
2032841
Title
Space charge measurements, dielectric spectroscopy and breakdown tests on new and aged polycarbonate [HVDC insulating materials]
Author
Alijagic-Jonuz, B. ; Morshuis, P.H.F. ; Smit, J.J.
Author_Institution
Fac. of Electr. Eng., Math. & Comput. Sci., Delft Univ. of Technol., Netherlands
fYear
2004
fDate
17-20 Oct. 2004
Firstpage
275
Lastpage
278
Abstract
Electrically stressed materials can be characterized as electrically aged only if we have evidence that the material changes due to the electrical stress are responsible for material failure, which is not always the case. Often, a large number of breakdown tests is needed to prove that a set of specimens is electrically aged. As an alternative, we can however also combine a smaller number of breakdown tests with some other method for material characterization. The latter approach was followed when studying polycarbonate with TiO2 filler, both new specimens and specimens that had been stressed for 860 hours at a DC voltage. Space charge measurements, dielectric spectroscopy tests in the frequency domain and breakdown tests were performed to check whether these methods provide us the same answer concerning the aging of PCTiO2.
Keywords
ageing; composite insulating materials; electric breakdown; filled polymers; space charge; titanium compounds; 860 h; DC voltage stressing; HVDC insulating materials; TiO2; dielectric breakdown; dielectric spectroscopy; electrical stress induced material changes; electrically aged materials; electrically stressed materials; filled polycarbonate; material failure; space charge measurements; Aging; Charge measurement; Current measurement; Dielectric breakdown; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Electrochemical impedance spectroscopy; HVDC transmission; Materials testing; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
Print_ISBN
0-7803-8584-5
Type
conf
DOI
10.1109/CEIDP.2004.1364241
Filename
1364241
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