• DocumentCode
    2033160
  • Title

    Possible mechanism of superior partial-discharge resistance of polyamide nanocomposites

  • Author

    Fuse, N. ; Kozako, M. ; Tanaka, T. ; Murase, S. ; Ohki, Y.

  • Author_Institution
    Waseda Univ., Shinjuku, Japan
  • fYear
    2004
  • fDate
    17-20 Oct. 2004
  • Firstpage
    322
  • Lastpage
    325
  • Abstract
    The dielectric properties of polyamide nanocomposites were examined, focusing especially on their resistance against partial discharges. The paper compares the surface roughness caused by partial discharges and that caused by exposure to plasmas, between polyamide with and without inorganic nanofillers. From X-ray diffraction spectroscopy, it was confirmed that the nanofillers are rearranged in parallel with their surfaces with a mutual distance around 1 nm after the nanocomposite was subjected to partial discharges. Such ordered arrangement of nanofillers should contribute to the high durability against partial discharges in polyamide nanocomposites, in addition to the effects of the presence of mica, high crystallinity, and strong ionic interaction at mica/resin interfaces. Furthermore, the result of a preliminary attempt to detect the structural change through observation of photoluminescence spectra is also reported.
  • Keywords
    X-ray diffraction; composite insulating materials; composite material interfaces; filled polymers; mica; nanocomposites; partial discharges; photoluminescence; 1 nm; Al2O3-K2O-SiO2; X-ray diffraction spectroscopy; crystallinity; dielectric properties; durability; inorganic nanofillers; mica/resin interface ionic interaction; ordered nanofiller arrangement; parallel nanofiller surface mutual distance; partial discharges; partial-discharge resistance mechanism; photoluminescence spectra; plasma exposure; polyamide nanocomposites; structural change; surface roughness; Dielectrics; Nanocomposites; Partial discharges; Plasma properties; Plasma x-ray sources; Rough surfaces; Surface discharges; Surface resistance; Surface roughness; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
  • Print_ISBN
    0-7803-8584-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2004.1364253
  • Filename
    1364253