DocumentCode
2033162
Title
Research the extension method of intelligence fault diagnosis
Author
Jianjun Qin ; Qiang Li
Author_Institution
Northern Jiaotong University
fYear
2002
fDate
19-19 June 2002
Firstpage
218
Lastpage
218
Keywords
Application software; Circuit faults; Electrical fault detection; Fault detection; Fault diagnosis; Feature extraction; Monitoring; Protection; Short circuit currents; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Automation, 2002. ICCA. Final Program and Book of Abstracts. The 2002 International Conference on
Conference_Location
Xiamen, Fujian Province, China
Print_ISBN
0-7803-7412-6
Type
conf
DOI
10.1109/ICCA.2002.1229728
Filename
1229728
Link To Document