Title :
Applying sensitivity analysis to the strategic evaluation of emerging technologies in taiwan semiconductor foundry industry
Author :
Chen, Hongyi ; Kocaoglu, Dundar F. ; Ho, Jonathan
fDate :
31 July-4 Aug., 2005
Keywords :
Foundries; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit technology; Pulp manufacturing; Robustness; Sensitivity analysis; Technology management; Testing; Virtual manufacturing;
Conference_Titel :
Technology Management: A Unifying Discipline for Melting the Boundaries
Print_ISBN :
1-890843-11-3
DOI :
10.1109/PICMET.2005.1509688
