Title :
Analysis and comparison of planar- and Trench-IGBT-Modules under ZVS and ZCS switching conditions
Author :
Helsper, M. ; Fuchs, F.W. ; Münzer, M.
Author_Institution :
Fac. of Eng., Christian-Albrechts-Univ. of Kiel, Germany
Abstract :
For qualification in resonant converters, a standard-IGBT-module, a fast-IGBT-module, both with IGBTs of the 2nd generation and two new trench-gate-IGBT-modules of the 3rd generation with different EMCON-Diodes are characterized and compared. A teststand was established, which works in the zero voltage or in the zero current mode. Investigations in the ZVS mode show that the trench-IGBT-module can be driven up to high frequencies in a low loss manner like the fast-IGBT-module which is optimized for this mode. In the ZCS mode the modules show comparable losses for low and medium frequencies. At very high frequencies the fast-IGBT-module and one of the tested trench-IGBT-modules show the best performance.
Keywords :
bipolar transistor switches; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; resonant power convertors; semiconductor device measurement; semiconductor device testing; switching circuits; EMCON-Diodes; ZCS switching conditions; ZVS switching conditions; device performance; planar-IGBT-modules; resonant power converters; trench-IGBT-modules; zero current switching; zero voltage switching; Circuit testing; Frequency; Insulated gate bipolar transistors; Power electronics; Power engineering and energy; RLC circuits; Resonance; Switching converters; Zero current switching; Zero voltage switching;
Conference_Titel :
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Print_ISBN :
0-7803-7262-X
DOI :
10.1109/PSEC.2002.1022521