• DocumentCode
    2033341
  • Title

    A demonstration IC for the P1149.4 mixed signal test standard

  • Author

    Loftstrom, K.

  • Author_Institution
    KLIC, Beaverton, OR
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    92
  • Lastpage
    98
  • Abstract
    The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented
  • Keywords
    CMOS integrated circuits; automatic testing; boundary scan testing; integrated circuit testing; measurement standards; mixed analogue-digital integrated circuits; CMOS IC; P1149.4 mixed signal test standard; characterization data; demonstration IC; mixed-signal boundary scan standard; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Measurement standards; Pins; Software testing; Switches; Switching circuits; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.556949
  • Filename
    556949
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2033341