Title :
Material nonlinearity limits on a Lamé-mode single crystal bulk resonator
Author :
Zhu, Haoshen ; Tu, Cheng ; Lee, Joshua E -Y
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Hong Kong, China
Abstract :
In this paper, the material nonlinearity in single crystal silicon (SCS) square-plate bulk-mode resonators is described as a strain-dependent shear modulus and incorporated into a lumped element model. The equivalent circuit of the fully differential setup is developed for the nonlinear oscillation cases. According to measurement results, the spring hardening effect in a bulk resonator is reported for the first time. Opposite nonlinear behaviors (spring softening and spring hardening) are detected in devices with same dimensions and driving mechanism but different crystalline orientations ([110] and [100]) indicating the material nonlinearity dominance. The experimental results are compared against the circuit simulation results in various conditions which validate the proposed model.
Keywords :
circuit oscillations; circuit simulation; crystal orientation; crystal resonators; equivalent circuits; hardening; micromechanical resonators; shear modulus; softening; Lamé-mode single crystal bulk resonator; SCS square-plate bulk-mode resonators; circuit simulation; crystalline orientations; driving mechanism; equivalent circuit; fully differential setup; lumped element model; material nonlinearity dominance; material nonlinearity limits; nonlinear behaviors; nonlinear oscillation cases; single crystal silicon square-plate bulk-mode resonators; spring hardening effect; spring softening; strain-dependent shear modulus; Fabrication; ISO; Materials; Mechanical factors; Nanoelectromechanical systems; Phase measurement; MEMS; Material nonlinearity; bulk resonator; modeling;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
DOI :
10.1109/NEMS.2012.6196817