Title :
Low cost fillers die attach materials development for powerpad and non powerpad packages with PPF LDF
Author :
Megan Chang ; Yu, F.
Author_Institution :
Texas Instrum. Taiwan Ltd., Taipei, Taiwan
Abstract :
This paper presents TI development of low cost fillers die attach materials for powerpad and non powerpad packages with PPF LDF. While silver fillers drive conductive die attach applications in semiconductor history, eagerness for a promising alternative filler die attach has been arising to get rid of silver filler die attach price impacted by silver price on the market. Besides the short term cost benefit, how to maintain the long term cost advantage across the rivals is another priority for development. Silver plated copper (SPC) filler die attach materials have attracted a lot of attentions due to the relative higher thermal conductivity and lower cost of metal copper comparing with other metals. Although there has been available silver plated copper die attach materials in semiconductor industry, however the low thermal conductivity constrains the application in powerpad packages especially for the weak adhesion performance of PPF Au/Pd/Ni LDF. In addition to silver plated copper fillers, many opportunities are being engaged and evaluated for promising long term cost advantages die attach materials for electronic packaging. Among of them, copper filler is the most interesting target for the super low cost die attach materials. Quality and reliability of low cost metals die attach materials have been validating via extensive evaluation plan on powerpad and non powerpad packages in recent and confirmed as noteworthy solutions for further development.
Keywords :
adhesion; conductive adhesives; electronics packaging; filler metals; gold alloys; microassembling; nickel alloys; palladium alloys; reliability; thermal conductivity; Au-Pd-Ni; PPF LDF adhesion performance; SPC filler die attach materials; TI development; conductive die attach applications; electronic packaging; long term cost advantage; low cost filler die attach material TI development; low cost metal die attach material quality; low cost metal die attach material reliability; metal copper; nonpowerpad packages; relative higher thermal conductivity; semiconductor industry; silver plated copper filler die attach materials; silver price; thermal conductivity; Conductivity; Copper; Materials; Materials reliability; Microassembly; Silver;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
DOI :
10.1109/EPTC.2012.6507091