Title :
Thermal interface void reduction techniques for direct-soldered power modules
Author :
Kim, Junhyung ; Jih-sheng Lai ; Konrad, Charles E.
Author_Institution :
Elgar Electron. Corp., San Diego, CA, USA
Abstract :
Mounting power modules by directly soldering them onto the heatsink can significantly reduce the thermal resistance between power module and heatsink as compared to the conventional bolted method that requires thermal grease or other interface materials in between. However, the problem of this mounting technique is the voids existing in the thermal interface. In this paper, void reduction techniques are studied through heating procedure, temperature profile using NC-559TM solder paste, which is commercially used for surface mount devices (SMD) mounting. In order to study the effect of void rate, a 15 MHz scanning acoustic microscope (SAM) is used as an inspection tool. To measure the thermal resistance of the interface, a constant current source injection into power diode along with thermal coupling test was adopted. Experimental results indicate that the reduction of void rate in the interface also significantly reduces the thermal resistance. Moreover, experimental results of the thermal resistances using the direct-soldered method and ThermstrateTM are compared. The thermal performance and temperature distribution are also studied by the finite element analysis using FlothermTM.
Keywords :
acoustic microscopes; finite element analysis; heat sinks; soldering; surface mount technology; temperature distribution; thermal resistance; Flotherm; NC-559 solder paste; Thermstrate; constant current source injection; direct-soldered power modules; finite element analysis; heating procedure; heatsink; power diode; power module mounting; scanning acoustic microscope; surface mount devices mounting; temperature distribution; temperature profile; thermal coupling; thermal interface; thermal interface void reduction techniques; thermal resistance reduction; Acoustic devices; Acoustic measurements; Heating; Inspection; Microscopy; Multichip modules; Soldering; Surface resistance; Temperature; Thermal resistance;
Conference_Titel :
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Print_ISBN :
0-7803-7262-X
DOI :
10.1109/PSEC.2002.1022542