Title :
Cycle Time Perspectives for Small Transfer Batch Size
Author :
Wright, D. Rex ; Chang, Tom
Author_Institution :
Asyst Technol., Inc., Fremont, CA
Abstract :
This paper discusses advantages and disadvantages of smaller transfer batch size in an automated semiconductor factory. A framework is suggested by which the "theoretical" cycle time is determined from the point-of-view of the wafer, not the lot. Using this framework, we then look at the possible application of a "virtual cluster tool" by identifying requirements on the process times and transport system. Benefits and risks are then discussed for the approach, using a simple example
Keywords :
factory automation; integrated circuit manufacture; materials handling; production facilities; automated material handling system; automated semiconductor factory; cycle time; transfer batch size; virtual cluster tool; Consumer products; Costs; Electronics industry; Job shop scheduling; Materials handling; Moore´s Law; Physics; Production facilities; Terminology; Time factors;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
Conference_Location :
Boston, MA
Print_ISBN :
1-4244-0254-9
DOI :
10.1109/ASMC.2006.1638775