DocumentCode :
2034095
Title :
Generation efficiency of planar n+-n-n+ diode with tunnel boundaries
Author :
Prokhorov, E.D. ; Botsula, O.V. ; Reutina, O.A.
Author_Institution :
V.N. Karazin Kharkiv Nat. Univ., Kharkiv, Ukraine
fYear :
2013
fDate :
8-14 Sept. 2013
Firstpage :
139
Lastpage :
140
Abstract :
The planar n+-n-n+ diode with tunnel lateral boundaries based on n-type epitaxial film which is grown on a semi-insulating GaAs substrate is considered. It is shown that having two sites with the tunneling characteristics on the lateral border of the planar diode leads to two areas of negative differential conductance on the current-voltage characteristic of the diode and leads to the generation of two zones of the voltage. The influence of the location and extent of the boundaries on the energy and frequency characteristics are shown. The experimental current-voltage curves of the structure are given.
Keywords :
III-V semiconductors; gallium arsenide; semiconductor diodes; semiconductor epitaxial layers; tunnelling; current-voltage characteristic; current-voltage curves; energy characteristic; frequency characteristic; generation efficiency; lateral border; n-type epitaxial film; negative differential conductance; planar diode; planar n+-n-n+ diode; semiinsulating gallium arsenide substrate; tunnel boundary; tunnel lateral boundary; tunneling characteristics; Abstracts; Current-voltage characteristics; Educational institutions; Electrical engineering; Electronic mail; Epitaxial growth; Gallium arsenide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1
Type :
conf
Filename :
6652759
Link To Document :
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