DocumentCode :
2034131
Title :
Sensitivity enhancement in SGOI nanowire biosensor fabricated by top surface passivation
Author :
Chang, Kow-Ming ; Chen, Chu-Feng ; Lai, Chiung-Hui ; Hsieh, Cheng-Ting ; Wu, Chin-Ning ; Wang, Yu-Bin ; Liu, Chung-Hsien
Author_Institution :
Dept. of Elec. Eng. & Inst. of Elec., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear :
2012
fDate :
5-8 March 2012
Firstpage :
579
Lastpage :
582
Abstract :
Increasing the fraction of Ge in SiGe-on-Insulator (SGOI) using Ge condensation by oxidation significantly increases hole mobility. This effect can be exploited to improve the sensitivity of SGOI nanowire. However, our previous studies found that the sensitivity of an SGOI nanowire is degraded as the Ge fraction increases over 20%, because of the surface state of SiGe is unstable when the Ge fraction is high. In this work, a top surface passtivation SiO2 layer was deposited on an Si0.8Ge0.2 nanowire and successfully improve its sensitivity around 1.3 times that of the nanowire sample without top a passivation layer.
Keywords :
Ge-Si alloys; biosensors; condensation; hole mobility; nanosensors; nanowires; oxidation; passivation; semiconductor materials; surface states; SGOI nanowire biosensor; SiGe; germanium condensation; germanium fraction; hole mobility; oxidation; surface state; top surface passivation; Atomic layer deposition; Biosensors; Nanoelectromechanical systems; Oxidation; Passivation; Silicon germanium; SiGe-on-Insulator; bio-sensor; passivation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
Type :
conf
DOI :
10.1109/NEMS.2012.6196842
Filename :
6196842
Link To Document :
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