• DocumentCode
    2034144
  • Title

    Flow modeling of die attach process and the optimization of process parameters in advance packaging

  • Author

    Lin Ji ; Leong Ching Wai ; Rhee, Min Woo Daniel

  • Author_Institution
    Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
  • fYear
    2012
  • fDate
    5-7 Dec. 2012
  • Firstpage
    379
  • Lastpage
    383
  • Abstract
    This paper presents a new numerical model to characterize the die attach process in the advance packaging. With its successful application on a 5 mm by 5 mm with 70um thickness die attached to the substrate, final fillet shape of the die attach material is predicted for various process conditions. Focuses have been given on the die attach material over flow on the die top surface. The contamination on the die top surface may cause failures in the subsequent processes. The simulation results were compared with the experiment. Good match was obtained. Moreover, process window for a given amount die attach material was established through the simulation and the corresponding bonding force that will not cause die attach material over flow was predicted. Key advantage of this numerical study is to give the insights into process parameters and provide initial process window to prevent die attach over flow.
  • Keywords
    bonding processes; contamination; microassembling; numerical analysis; packaging; advance packaging; bonding force; contamination; die attach process; flow modeling; numerical model; process parameters optimization; size 5 mm; size 70 mum; Conferences; Decision support systems; Electronics packaging; Hafnium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4553-8
  • Electronic_ISBN
    978-1-4673-4551-4
  • Type

    conf

  • DOI
    10.1109/EPTC.2012.6507111
  • Filename
    6507111