DocumentCode :
2034208
Title :
Environmental effects on connector reliability
Author :
Koford, Stuart
Author_Institution :
Koford Eng., Addison, IL, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
215
Lastpage :
217
Abstract :
The author examines data gathered from a multiyear in-depth analysis of signal and power connectors used in aircraft as well as connectors used on ground-based computers, flight simulators and test equipment. The equipment was from the period 1954-1986 and included a wide range of connector technologies and connector finishes including gold, silver, rhodium, and tin. All types of connectors were evaluated including circular, rectangular, card edge, ZIF, and RF connectors of both military and commercial type. Analysis of field failures was performed using SEM (scanning electron microscope) and EDX technology. Gold over nickel plating showed the best performance of all of the finishes. It shows the capability to resist corrosion even after many years, and with a nonporous nickel underplate there is no diffusion of base metals through the gold
Keywords :
electric connectors; environmental testing; failure analysis; reliability; EDX technology; RF connectors; SEM; ZIF; aircraft; card edge; circular connectors; connector finishes; connector reliability; connector technologies; corrosion; field failures; flight simulators; ground-based computers; power connectors; rectangular connectors; signal connectors; test equipment; Aerospace simulation; Aircraft; Analytical models; Computational modeling; Connectors; Gold; Military computing; Nickel; Scanning electron microscopy; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163879
Filename :
163879
Link To Document :
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