DocumentCode :
2034262
Title :
Electrode design optimization of a CMOS fringing-field capacitive sensor
Author :
Li, Yu-Ting ; Tzeng, Yen-Lin ; Chao, Chih-Ming ; Wang, Kerwin
Author_Institution :
Dept. of Mechatron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
fYear :
2012
fDate :
5-8 March 2012
Firstpage :
603
Lastpage :
606
Abstract :
The capacitance of a micro-capacitive-sensor is mainly depends on its electrode structures, electrode arrangement and the dielectric strength of its surrounding. This paper presents a novel electrode design to enhance the fringing-field and to increase the capacitance of a CMOS MEMS capacitive sensor. The design optimization process is assisted by COMSOL, a multi-physics finite-element simulation tool. The design goal is to maximize the fringing-field of capacitive sensor. The capacitor has been built with a VLSI Schmitt trigger, and temperature compensator to probe the capacitance. The experiment results show that proposed capacitor can achieve the capacitance to 75.2 pF.
Keywords :
CMOS integrated circuits; capacitive sensors; electrodes; finite element analysis; microsensors; optimisation; CMOS MEMS capacitive sensor; CMOS fringing-field capacitive sensor; COMSOL; VLSI Schmitt trigger; design optimization process; dielectric strength; electrode arrangement; electrode design optimization; electrode structures; microcapacitive-sensor; multiphysics finite element simulation tool; temperature compensator; CMOS integrated circuits; Capacitance; Electrodes; Heating; Micromechanical devices; Robot sensing systems; Silicon; capacitance; fringing field; mesh-electrode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-1122-9
Type :
conf
DOI :
10.1109/NEMS.2012.6196848
Filename :
6196848
Link To Document :
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