• DocumentCode
    2034262
  • Title

    Electrode design optimization of a CMOS fringing-field capacitive sensor

  • Author

    Li, Yu-Ting ; Tzeng, Yen-Lin ; Chao, Chih-Ming ; Wang, Kerwin

  • Author_Institution
    Dept. of Mechatron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
  • fYear
    2012
  • fDate
    5-8 March 2012
  • Firstpage
    603
  • Lastpage
    606
  • Abstract
    The capacitance of a micro-capacitive-sensor is mainly depends on its electrode structures, electrode arrangement and the dielectric strength of its surrounding. This paper presents a novel electrode design to enhance the fringing-field and to increase the capacitance of a CMOS MEMS capacitive sensor. The design optimization process is assisted by COMSOL, a multi-physics finite-element simulation tool. The design goal is to maximize the fringing-field of capacitive sensor. The capacitor has been built with a VLSI Schmitt trigger, and temperature compensator to probe the capacitance. The experiment results show that proposed capacitor can achieve the capacitance to 75.2 pF.
  • Keywords
    CMOS integrated circuits; capacitive sensors; electrodes; finite element analysis; microsensors; optimisation; CMOS MEMS capacitive sensor; CMOS fringing-field capacitive sensor; COMSOL; VLSI Schmitt trigger; design optimization process; dielectric strength; electrode arrangement; electrode design optimization; electrode structures; microcapacitive-sensor; multiphysics finite element simulation tool; temperature compensator; CMOS integrated circuits; Capacitance; Electrodes; Heating; Micromechanical devices; Robot sensing systems; Silicon; capacitance; fringing field; mesh-electrode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2012 7th IEEE International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-1122-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2012.6196848
  • Filename
    6196848