DocumentCode :
2034390
Title :
Prognostic/Diagnostic Health Management System (PHM) for Fab Efficiency
Author :
Sun, Chin ; Nguyen, Kevin ; Vu, Long ; Bisland, Scott G.
Author_Institution :
Quality Wise Knowledge Solutions, San Jose, CA
fYear :
2006
fDate :
22-24 May 2006
Firstpage :
433
Lastpage :
438
Abstract :
In this work, a prognostic/diagnostic approach was made to use knowledge-based system to accelerate the process/equipment faults detection and classification. The domain knowledge within the fab environment can be either captured by PHM systems or populated by the experienced engineers. With the implementation of the proposed PHM system, domain knowledge stored in the PHM-equip and PHM-APC (advanced process control) subsystems will feed forward and feed backward through the entire process flow. For example, device information from the PHM-BE (back end) subsystems will be easily shared with process and equipment engineers. Likewise, process information from PHM-Equip and PHM-APC subsystems can also be shared with device and test engineers to achieve a fab-wide collaboration environment. These PHM systems are executed in a formal factory automation environment with all the correct compliances for equipment interface and integration plus MES connectivity
Keywords :
factory automation; fault diagnosis; knowledge based systems; knowledge management; manufacturing systems; process control; PHM-APC subsystem; PHM-BE subsystems; PHM-equip subsystem; advanced process control; diagnostic health management system; fab efficiency; fab environment; fab-wide collaboration environment; factory automation environment; fault classification; fault detection; knowledge-based system; process information; prognostic health management system; Acceleration; Collaboration; Fault detection; Feeds; Knowledge based systems; Knowledge engineering; Manufacturing automation; Process control; Prognostics and health management; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
1-4244-0254-9
Type :
conf
DOI :
10.1109/ASMC.2006.1638797
Filename :
1638797
Link To Document :
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