DocumentCode
2034535
Title
Challenges of advanced wafer level packaging technology: Cost-effectiveness, integration and scalability
Author
Seung Wook Yoon
Author_Institution
STATS ChipPAC Ltd., Singapore, Singapore
fYear
2012
fDate
5-7 Dec. 2012
Firstpage
451
Lastpage
455
Abstract
Currently various wafer level packaging (WLP) technologies are now cruising at a very high altitude, especially in mobile and portable applications. This is significant trend in packaging business: over 25 billion WLP units are expected to be mounted in smart-phones, tablet PCs or portable devices in 2012. Cost reduction together with miniaturization remains the main driver for adoption of WLP technology. Compared to conventional wire bonding and flipchip packaging, wafer level packaging needs higher capex investment because it has fab-like tools for redistribution process with thin film metals and dielectric polymers. Further cost reduction is a critical factor for penetration into market beyond current market boundaries. And WLP size is increasing with higher IO density and integration of functionality, so board level reliability would be key challenge for moving into broader application areas. In this paper, there will be discussion of technical challenges and market needs of advanced wafer level packaging technology, including fan-in, fan-out (FO), bumping and TSV (Silicon Through Via) etc. And potential solutions and industry approach for those challenges will be presented. Some deeper insights on business opportunities and cost reduction approaches in wafer level packaging in materials and processes will be presented. Lastly new trend of wafer level packaging technology will be discussed including large panel or scalability for high volume production.
Keywords
cost reduction; dielectric materials; investment; polymers; wafer level packaging; TSV; board level reliability; capex investment; cost reduction; dielectric polymer; fab-like tool; fan-in; fan-out; mobile application; portable application; portable device; redistribution process; silicon through via; smart-phone; tablet PC; thin film metal; wafer level packaging technology; Mobile communication; Packaging; Performance evaluation; Substrates; Through-silicon vias; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location
Singapore
Print_ISBN
978-1-4673-4553-8
Electronic_ISBN
978-1-4673-4551-4
Type
conf
DOI
10.1109/EPTC.2012.6507126
Filename
6507126
Link To Document