DocumentCode :
2034601
Title :
Capturing interface toughness parameters from shear testing using different fracture mechanics approaches
Author :
Auersperg, J. ; Dudek, Rainer ; Bramer, B. ; Pufall, R. ; Seiler, Bettina ; Michel, Bruno
Author_Institution :
Micro Mater. Center, Fraunhofer ENAS, Chemnitz, Germany
fYear :
2012
fDate :
5-7 Dec. 2012
Firstpage :
467
Lastpage :
473
Abstract :
Simple adhesion tests like the pull-out test or the button shear tests have been used in industry for decades. They offer a great potential for comparison of different molding compounds, encapsulants, or adhesives on different types of substrates with or without surface treatment. However, for theoretical prediction purposes, interface fracture mechanics parameters are needed. Quantitative evaluations of the test applied to molding compound (MC)-button on Cu-leadframe by different fracture- and damage mechanical approaches are the subjects of the paper. Defect tolerant methodologies like the "virtual crack closure technique" (VCCT) and the J-inter-action integral approach, which consider the interface initially delaminated, are compared to the damage methodology “cohesive zone modelling (CZM)”, which needs no initial crack and can track the delamination progress. Calculated fracture parameters, in particular the energy release rates and mode mixity are compared. Effects on these parameters are discussed for different button shapes. In-situ tracking of dela-mination progress for a cubic button is shown using the optical correlation technique microDAC.
Keywords :
copper; cracks; delamination; electronics packaging; fracture mechanics; moulding; testing; CZM; Cu; J-interaction integral; VCCT; adhesion tests; cohesive zone modelling; damage methodology; defect tolerant methodology; delamination progress; fracture mechanics; in-situ tracking; interface toughness parameter; microDAC; molding compound button; optical correlation technique; quantitative evaluations; shear testing; virtual crack closure technique; Delamination; Finite element analysis; Loading; Shape; Stress; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
Type :
conf
DOI :
10.1109/EPTC.2012.6507129
Filename :
6507129
Link To Document :
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