• DocumentCode
    2034654
  • Title

    A cost-effective true random bit generator using a pair of robust signum-based chaotic maps

  • Author

    San-Um, Wimol ; Ketthong, Patinya ; Chankasame, Winai ; Noymanee, Jeerana

  • Author_Institution
    Master Program of Eng. Technol., Thai-Nichi Inst. of Technol. (TNI), Bangkok, Thailand
  • fYear
    2015
  • fDate
    28-30 July 2015
  • Firstpage
    1305
  • Lastpage
    1310
  • Abstract
    This paper presents a cost-effective random-bit generator through a newly proposed inverted signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibria and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using a cost effective Arduino with Atmel SAM3X8E ARM Cortex-M3 CPU. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.
  • Keywords
    Lyapunov methods; bifurcation; chaos; frequency-domain analysis; random number generation; security of data; time-domain analysis; Jacobian analysis; Lyapunov exponent; TRB; bifurcation diagram; chaos dynamics; cobweb plot; computer information security; frequency domain signal; inverted signum-based piecewise-linear chaotic map; time domain signal; true random bit generator; zero-thresholding; Bifurcation; Chaotic communication; Generators; NIST; Robustness; Robust; Signum-Based Chaotic Maps; True Random Bit Generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Information Conference (SAI), 2015
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1109/SAI.2015.7237311
  • Filename
    7237311