DocumentCode :
2034736
Title :
Wire bond and molding factors influencing bare Cu wire surface conditions
Author :
Chan Wai Kok ; Tham Veng Leong ; Wang Mei Yong
Author_Institution :
Infineon Technol. Asia Pacific Pte. Ltd., Singapore, Singapore
fYear :
2012
fDate :
5-7 Dec. 2012
Firstpage :
504
Lastpage :
510
Abstract :
Bare copper (Cu) wire is one of the promising materials used in assembly packaging to replace gold wire. As copper is harder compared to gold, the formation of the looping during wire bonding is a concern and challenge especially to ball neck surface condition. Thus, the objective of this paper is to identify the key parameters that are having significant impact on the ball neck surface condition at wire bond and molding process. Evaluations are performed and the result do identified key factors that are having impact to the ball neck surface condition.
Keywords :
copper; lead bonding; moulding; packaging; Cu; assembly packaging; ball neck surface condition; molding factors; wire bond; wire surface conditions; Conferences; Decision support systems; Electronics packaging; Erbium; Logic gates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2012 IEEE 14th
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4553-8
Electronic_ISBN :
978-1-4673-4551-4
Type :
conf
DOI :
10.1109/EPTC.2012.6507134
Filename :
6507134
Link To Document :
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