• DocumentCode
    2035077
  • Title

    Experimental and analytical investigation of thermally induced warpage for printed wiring boards

  • Author

    Yeh, C.P. ; Banerjee, Kunal ; Martin, T. ; Umeagukwu, C. ; Fulton, R. ; Stafford, J. ; Wyatt, K.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1991
  • fDate
    11-16 May 1991
  • Firstpage
    382
  • Lastpage
    387
  • Abstract
    An analytical approach using finite-element techniques has been developed to simulate PWB (printed wiring board) thermo-mechanical behavior. To validate the analytical approach, a separate experimental approach is being conducted. Four different experimental techniques were investigated for their suitability for PWB warpage measurements: ultrasonics, laser, projection speckle (using vision system), and shadow moire. The shadow moire method has been chosen for measuring warpage of PWBs because it offers good resolution and full-field measurement. Seven test samples with different configurations were carefully designed and fabricated to ensure that the thermally induced warpage would be sufficient for measurement. These test samples consist of copper layers and various FR-4 dielectric layers. Two specimen configurations were tested for a temperature range from 25°C to 100°C. Attempts have also been made to correlate the experimental results with the analytical results, although accurate material properties are not known. A good match was obtained for a set of material properties extracted from a number of publications
  • Keywords
    deformation; finite element analysis; light interferometry; printed circuit testing; printed circuits; spatial variables measurement; 25 to 100 degC; Cu layers; FR-4 dielectric layers; PWB; finite-element techniques; full-field measurement; laser; printed wiring boards; projection speckle; shadow moire method; thermally induced warpage; thermo-mechanical behavior; thermomechanical behaviour simulation; ultrasonics; vision system; warpage measurements; Analytical models; Dielectric measurements; Finite element methods; Machine vision; Material properties; Speckle; Testing; Thermomechanical processes; Ultrasonic variables measurement; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1991. Proceedings., 41st
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-0012-2
  • Type

    conf

  • DOI
    10.1109/ECTC.1991.163904
  • Filename
    163904